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Defect and Microstructure Analysis by Diffraction

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In Stock (950)

£ 344.25

Description

Examines the state of the art for determining the "real" structure of matter. This book provides an analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns. It presents the principal characterization technique permitting us to measure the defect solid state: X-ray diffraction.

Book Details
EAN:
9780198501893
Binding:
Hardback
Dimensions(mm):
238 x 164 x 49
Publication Date:
2000-01-06
Publication Country:
United Kingdom