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Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction

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£ 103.95

Description

Presents an introduction to practical aspects of atomic-resolution imaging in aberration-corrected electron microscopy. This book addresses advances in electron optical instrumentation used for ultra-high resolution imaging in materials and nano-science.

Book Details
EAN:
9781848165366
Binding:
Hardback
Dimensions(mm):
254 x 175 x 20
Publication Date:
2010-09-01
Publication Country:
United Kingdom