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Monte Carlo Modeling for Electron Microscopy and Microanalysis
By David C. Joy
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£ 168.75
This book is a practical guide to the use of Monte Carlo simulation techniques for the study of electron solid interactions in the electron microscope. Programs, optimized for use on personal computers, are developed to deal with typical applications including secondary, and back- scattered, electron imaging. EBIC imaging of semiconductors and X-ray microanalysis.