Free Shipping to all UK customers for orders over £25.00

0 Total items on my wish-list.

Free Shipping to all UK customers for orders over £25.00

Ryefieldbooks Logo

Ryefield Books

Free Shipping to all UK customers for orders over £25.00

Ryefieldbooks Logo

Ryefield Books

© Copyright Ryefield Books - All Right Reserved
Product Categories
My Shopping Cart
Void image

You shopping cart is empty

You may browse our offerings to locate what you're
searching for, then put it in your shopping cart.

Book cover image

Photo-induced Defects in Semiconductors

Usually dispatched within 3 - 5 business days.

In Stock (508)

£ 61.20

Description

This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. These metastable defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices.

Book Details
EAN:
9780521024457
Binding:
Paperback / softback
Dimensions(mm):
229 x 152 x 14
Publication Date:
2006-03-09
Publication Country:
United Kingdom